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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science)Fro
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This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
- Sales Rank: #3514275 in Books
- Published on: 1999-01-31
- Original language: English
- Number of items: 1
- Dimensions: 9.21" h x .75" w x 6.14" l, 1.30 pounds
- Binding: Hardcover
- 255 pages
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